Fabrication based statistical design of monolithic IC's

In this paper we discuss the statement of Yield Maximization problem and the choice of design parameters when considering statistical design of monolithic ICs. Specifically, yield maximization cannot be carried out in terms of the nominal values of the eiecxncai parameiers oc iw s eminents. MI extension to me exisong methods and a new formulation of the Yield Maximization problem for monolithic ICs is proposed. The necessity of employing a SNiHjlator of the manufacturing process • which retafess a circuit eiecxncat oenavtor to tne pnyscaiiy oseignanie parameters , is shown.